Atomic Force Microscopy (AFM) Market – Global Industry Size, Share, Trends, Opportunity, and Forecast, Segmented By Offering (Atomic Force Microscopes, Probes, Software), By Grade (Research Grade AFM, Industrial Grade AFM), By Application (Academics, Semiconductors & Electronics, Life Sciences, Material Science, Others), By Region, and By Competition Forecast, 2021-2031F

Forecast Period	2027-2031
Market Size (2025)	USD 502.25 Million
CAGR (2026-2031)	5.87%
Fastest Growing Segment	Software
Largest Market	Asia Pacific
Market Size (2031)	USD 707.22 Million

Market Overview

The Global Atomic Force Microscopy (AFM) Market will grow from USD 502.25 Million in 2025 to USD 707.22 Million by 2031 at a 5.87% CAGR. Atomic Force Microscopy (AFM) is a high-resolution scanning probe technique that utilizes a cantilever with a sharp tip to measure surface topography and physical properties at the nanoscale. The market is primarily supported by the continuous miniaturization of semiconductor devices and increased funding for nanotechnology research, both of which necessitate precise metrology for quality assurance and defect analysis. This industrial demand is substantial; according to SEMI, in 2024, global sales of total semiconductor manufacturing equipment were forecast to reach a record $113 billion, reflecting the robust capital expenditure environment that drives the procurement of inspection systems.

Despite this expansion, a significant challenge hindering broader adoption is the inherent limitation in scanning speed compared to optical microscopy. The time-intensive nature of the scanning process restricts sample throughput, which complicates the integration of AFM into high-volume manufacturing lines where rapid cycle times are essential. Consequently, this bottleneck often limits the technology to offline laboratory analysis rather than real-time, inline production monitoring.

Key Market Drivers

Rising demand for semiconductor wafer inspection and failure analysis acts as the foremost catalyst propelling the Global Atomic Force Microscopy (AFM) Market. As fabrication nodes continue to shrink, manufacturers increasingly rely on the superior vertical resolution of AFM to detect non-visual defects and measure critical dimensions that optical methods cannot resolve. This reliance is intensified by the industry's massive production scale, where precise metrology is essential for yield management in high-value manufacturing. According to the Semiconductor Industry Association, February 2025, global semiconductor sales reached a record total of $627.6 billion in 2024, reflecting the immense industrial activity that necessitates advanced inspection capabilities. Consequently, fabrication facilities are integrating automated AFM systems to ensure quality control across these expanding production lines.

Simultaneously, the expansion of nanotechnology and nanomaterials research initiatives provides a robust foundation for market growth, underpinned by sustained public investment. AFM remains the standard tool for characterizing material properties at the atomic level, essential for investigating novel composites and biological samples. This research ecosystem is heavily supported by federal grants aimed at advancing scientific leadership; according to the National Nanotechnology Coordination Office, December 2024, the President's 2025 Budget requested over $2.2 billion for the National Nanotechnology Initiative. This consistent funding allows academic and government laboratories to procure advanced instrumentation, directly driving revenue for key market players. Illustrating this segmental momentum, according to Bruker Corporation, in 2025, the company's BSI NANO segment, which houses its AFM business, reported fiscal year 2024 revenue of $1.10 billion.

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Key Market Challenges

The inherent limitation in scanning speed represents a critical bottleneck restricting the Global Atomic Force Microscopy (AFM) Market from penetrating the lucrative high-volume manufacturing sector. Unlike optical inspection systems that can capture surface data almost instantaneously, AFM relies on a physical probe traversing the sample surface, a mechanical process that significantly extends data acquisition time. This fundamental constraint creates a severe throughput disparity, rendering standard AFM configurations unsuitable for real-time, inline wafer inspection where rapid cycle time is a primary performance metric.

This inability to match production line speeds directly hampers market expansion given the immense scale of modern semiconductor fabrication. The industry operates at volumes that demand rapid metrology solutions to maintain yield without slowing output. According to SEMI, in 2024, global installed wafer fab capacity reached 40.5 million wafers per quarter during the second quarter. With such massive throughput requirements, manufacturers cannot accommodate the latency of atomic force microscopy for general inspection. Consequently, AFM remains largely confined to offline failure analysis and R&D applications, preventing vendors from tapping into the substantially larger capital budgets allocated for high-speed, inline process control equipment.

Key Market Trends

The Advancement of Fully Automated Scanning Workflows is fundamentally reshaping the market by eliminating the steep learning curve traditionally associated with atomic force microscopy. Historically, obtaining high-quality nanoscale data required expert operators to manually adjust complex feedback parameters, but modern systems now incorporate intelligent algorithms to autonomously manage tip-sample engagement and scan optimization. This shift towards user-centric design allows diverse industries to deploy AFM for routine measurements without specialized training, democratizing access to the technology beyond dedicated surface scientists. This operational evolution is translating into substantial financial performance; according to Park Systems, February 2025, in the 'Financial Statements 2024', the company reported annual sales revenue of 175 billion KRW, a result attributed to the widening adoption of its automated metrology solutions across both industrial and academic sectors.

Simultaneously, the Emergence of Correlative and Multi-Modal Platforms is gaining traction as researchers increasingly require comprehensive material insights that topography alone cannot provide. By integrating AFM with complementary techniques such as Raman spectroscopy or scanning electron microscopy, these hybrid systems enable the simultaneous acquisition of physical, chemical, and structural data from the exact same nanoscale region. This synergy is particularly critical for analyzing complex heterogeneous materials where correlating structural features with chemical composition is essential for accurate characterization. The demand for such multifaceted analysis is actively driving segment growth; according to Oxford Instruments, June 2024, in the 'Annual Report 2024', the Materials & Characterisation segment delivered revenue of £252.2 million, reflecting an 11.4% increase driven by the robust sales of its advanced microscopy portfolio, including correlative AFM and Raman systems.

Segmental Insights

The Software segment is projected to be the fastest-growing category within the Global Atomic Force Microscopy (AFM) Market, driven by a broad industry shift toward digitalization and automation. Leading market analysis indicates that modern control programs are increasingly vital for improving workflow efficiency and instrument accessibility. These solutions enable automated tip engagement and scan optimization, which significantly reduces the need for manual intervention. Furthermore, the integration of artificial intelligence simplifies complex data analysis, allowing non-specialist operators to perform precise nanoscale characterization within semiconductor and material science sectors.

Regional Insights

Asia Pacific commands the largest share of the Global Atomic Force Microscopy (AFM) Market, primarily due to its established dominance in the semiconductor and electronics sectors. Major manufacturing hubs in China, Taiwan, Japan, and South Korea necessitate precise metrology tools for wafer inspection and failure analysis at the nanoscale level. Additionally, consistent government investment in nanotechnology and materials science research fuels the adoption of these instruments within academic and industrial laboratories. This dual demand from high-volume production environments and research institutions secures the region’s leading position in the global industry.

Recent Developments

• In January 2025, Park Systems Corporation announced the acquisition of Lyncée Tec SA, a company based in Switzerland known for its Digital Holographic Microscopy (DHM) technology. This strategic transaction aimed to enhance Park Systems' optical metrology offerings by incorporating DHM's ability to capture instantaneous 3D surface data. The company planned to integrate this technology with its existing atomic force microscopy platforms to develop hybrid systems for the semiconductor industry. The collaboration was expected to provide advanced inspection solutions for applications such as advanced packaging, combining the high speed of holographic imaging with the high resolution of AFM.
• In December 2024, Bruker Corporation introduced the Dimension Nexus atomic force microscope at the MRS Fall Meeting & Exhibit. The system was designed to provide a high-performance measurement platform for research laboratories and multi-user facilities. Equipped with the NanoScope 6 controller, the Dimension Nexus supported over 50 operational modes, including the company's PeakForce Tapping technology. The microscope offered a compact design while maintaining the capability to generate high-quality data for diverse applications. This product launch addressed the market need for a versatile and accessible AFM solution that could accommodate the evolving requirements of academic and industrial researchers.
• In September 2024, Oxford Instruments Asylum Research released the Vero VRS1250, an atomic force microscope capable of video-rate imaging with scan rates up to 1250 lines per second. The system was the first to employ Quadrature Phase Differential Interferometry (QPDI) for cantilever sensing, a method that improved measurement accuracy by detecting true vertical tip displacement. The Vero VRS1250 also incorporated blueDrive photothermal excitation technology to ensure stability during high-speed operations. This release was intended to support researchers in materials science and biophysics by offering a robust instrument for observing dynamic nanoscale processes with high temporal resolution.
• In January 2024, ICSPI launched the Redux AFM, an automated benchtop atomic force microscope developed to improve access to nanoscale imaging. This instrument utilized the company's AFM-on-a-chip technology, which integrated essential components onto a single chip to streamline operation. The Redux AFM removed the need for complex setup procedures such as laser alignment and probe exchange, enabling users to acquire 3D data rapidly. Featuring a motorized stage and simple configuration, the system was engineered to provide scientists and engineers with an efficient and user-friendly tool for routine nanoscale characterization across various research and industrial applications.

Key Market Players

• Bruker Corporation
• Park Systems Corporation
• Oxford Instruments plc
• Horiba, Ltd.
• Hitachi High-Technologies Corporation
• Nanosurf AG
• WITec GmbH
• NT-MDT Spectrum Instruments
• NanoMagnetics Instruments Ltd.
• Nanonics Imaging Ltd.

By Offering	By Grade	By Application	By Region
Atomic Force Microscopes Probes Software	Research Grade AFM Industrial Grade AFM	Academics Semiconductors & Electronics Life Sciences Material Science Others	North America Europe Asia Pacific South America Middle East & Africa

Report Scope:

In this report, the Global Atomic Force Microscopy (AFM) Market has been segmented into the following categories, in addition to the industry trends which have also been detailed below:

• Atomic Force Microscopy (AFM) Market, By Offering:

• Atomic Force Microscopes
• Probes
• Software

• Atomic Force Microscopy (AFM) Market, By Grade:

• Research Grade AFM
• Industrial Grade AFM

• Atomic Force Microscopy (AFM) Market, By Application:

• Academics
• Semiconductors & Electronics
• Life Sciences
• Material Science
• Others

• Atomic Force Microscopy (AFM) Market, By Region:

• North America
• United States
• Canada
• Mexico
• Europe
• France
• United Kingdom
• Italy
• Germany
• Spain
• Asia Pacific
• China
• India
• Japan
• Australia
• South Korea
• South America
• Brazil
• Argentina
• Colombia
• Middle East & Africa
• South Africa
• Saudi Arabia
• UAE